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| Titre: | Structural and optical characterization of black silicon |
| Auteur(s): | Nabila, Hadjilat |
| Mots-clés: | black silicon, peaks, absorption, infrared, yields, night vision, characterization |
| Date de publication: | 6-jan-2025 |
| Collection/Numéro: | Mémoire de Master; |
| Résumé: | Black silicon is composed of millions of small peaks on its surface. These peaks absorb not only twice as much visible light as traditional silicon, but also infrared radiation, which normal silicon is incapable of.
Black silicon is in fact 100 to 500 times more sensitive to light than normal silicon. As a result, quantum and photovoltaic yields could be significantly improved. Black silicon could have a big impact on night vision technologies and digital photography.
On the basis of subsequent studies, different black silicon samples will be characterized. Different techniques will be used to characterize optical and electric properties of black silicon samples and carry out this Master thesis. |
| URI/URL: | http://dspace.univ-setif.dz:8888/jspui/handle/123456789/4981 |
| Collection(s) : | Mémoires de master
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